GenIndex

Luxpop Index of Refraction, Thin film, Optical simulation and ray tracing

Click on box for calculation: thin film, polarization, optical simulation, ray trace, and more.

Luxpop Miniblog
24/Apr/2015 added index of CNGS and Nd:CNGS, per results of SKLCM/ICM Shandong University. These are two CGG-type laser crystals that could be promising as solid-state laser crystals due to good mech properties, low CTE, high specific heat andd other attributes. Both ordinary and extraordinary indices provided.
15/Mar/2015 updated ray tracing with full meridional, tangential, and skew rays
24/Feb/2015 released beta version of ray tracing for optical simulation.Full rigorous ray tracing with up to four surfaces an arbitrary angles.
1/Feb/2015 added index of Ge25Sb10Se65 thin films at various deposition pressures. This amorphous chalcogenide material has good potential for sensor application in the mid-IR range. Characterized by teams at CNRS and Universite de Rennes 1, along with U de Nantes and U of Pardubice Czech Rep. Also added index of CH3NH3PbI3, as detemined by team at the School of Physics, Peking University, CAS Qingdao, and  OKeanos. This material has great light absorption characteristics, making them highly desirable for solar cells.
20/Feb/2014 added index of refraction of ATO [antimony (Sb)-doped tin oxide (6 wt.% Sb2O3-doped SnO2)], from the Leem, Lee et al ref (Kyung Hee/Sungkyunkwan/KANFC). ATO is used as a seed layer to generate gallium oxide hydroxide (GaOOH) nanopillars for the purpose of anti-reflection coatings that can be fabricated using a cost-effective, simple and low temperature deposition method. For ATO, values of n in the 1.7 to 1.9 can be obtained across the solar spectrum, with extremely low loss k.
17/Jan/2014 added new function called "filtpix" to code entry, which allows user to select a nanostructured filter under various conditions and determine behaviour such as reflection or transmission. As a first example the function implements selected filter pixels in the  Girard-Desprolet, Boutami et al ref from Minatec, which consist of cross-holes nanostructured metallic filters. This ref elegantly demonstrates the flexibility of these structures and the design freedom granted by these new metamaterials: instead of growing expensive complex multi-layered structures, it is possible to use CMOS fabrication technology to implement designs of arbitrary functionality at a lower cost and with higher repeatability, leveraging existing industrial infrastructure. Click on the  fading pixel picture below beside the code entry window for samples.	
18/Dec/2013 feedback from Chien: I like to use the OPO Op point to calculate the PPLN grating period{ed: Optical Parametric Oscillators on periodically poled lithium niobate}. (Can you bring it back?) Reply: this calculation had been deactivated some time ago because it was not very popular, but has now been brought back per this and other requests. It is now operational again. Thank you for the feedback.
16/Dec/2013 added index of refraction of negative index plasmonic metamaterial thin film with subwavelength nanonotch structures. For the purposes of index calculation on this site, this material is called p1985_6Au_5Kap_8nn, given its unit cell's 1985 nm outside dimension, 6 gold and 5 kapton layers and 8 nanonotches. With this material, designers have engineered a broad flat passband in the 3000 to 3700 nm range with smooth transition of the real index index of refraction from +1 to -1 within the passband, illustrating the degree of spectral control possible with techniques as described in the ref. From the Jiang, Lin et al ref, of Penn State.
9/Dec/2013 added index of refraction of K0.95Na0.05Ta0.58Nb0.42O3 (KNTN) in the visible and NIR. These crystals are interesting in that they have very interesting electro-optic, electrostriction, and electroholography properties, which may make them good candidates for communications devices. Moreover, they are lead-free, which offers additional environmental and fabrication advantages. The material dispersion can be described by a single term single term Sellmeier equation, which makes for simple modeling. From the HIT/DMU Yao, Tian et al ref.
5/Dec/2013 Feedback from ??:I have used your site numerous times to calculate refractive index at different wavelengths of Fused Silica (amorphous) and it appears that the data that is being calculated has changed drastically.I have cross referenced with other sources and it appears to be wrong. Please let me know what the source of the issue is? At 633 nm and room temperature; fused silica should have a refractive index of 1.45705 but your program is giving 1.45834 ANSWER From Luxpop. The feedback is correct. The answer given by Luxpop was wrong as of the date of the feedback (Dec/3). This has now been fixed. Investigation into the root cause of this is ongoing . It appears the database entry for SiO2a was impacted during site updating on Nov/22. As such the returned answer for index of refraction on amorphous SiO2a was off by the noted 0.001 from Nov/22 to today. Luxpop will review its validation procedures in light of this  incident and verify other related materials as well. Many thanks to the anonymous contributor who pointed this out.